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International Testing Conference

Posted in Events and improvement,Software testing by testing in London on September 16, 2007

From Earth Times

International Test Conference, the highlight of the annual Test Week activities and the leading forum for testing technology, promises to engage and stimulate attendees from the test and design community with its technical program and activities when the doors open at the 38th annual ITC. The theme for this year’s conference is Facing Nanometer-technology Test Challenges. Test Week 2007 runs from October 21 – October 26 at the Santa Clara Convention Center in Santa Clara, California. ITC’s Advance Program and online registration are available on its Web site at

ITC, the cornerstone of the Test Week event, is known worldwide for the strength of its technical program, which attracts many top researchers, and industry experts who choose ITC to present the results of their work. Offerings throughout the week incorporate a wide variety of technical activities targeted at test and design theoreticians and practitioners, including: formal paper sessions, tutorials, panel sessions, lecture series sessions, advanced industrial practices sessions, workshops, commercial exhibits and a host of professional fringe meetings. Taken together, these activities provide a week-long educational experience that will benefit people new to testing and experts.

ITC Test Week kicks off with 16 one-day tutorials presented by the IEEE Computer Society’s Test Technology Technical Council (TTTC) on the two days prior to the conference technical program, October 21 and 22. They are geared for entry-level attendees as well as those wishing to expand their knowledge in a particular area, and cover such topics as design-for-manufacturing, failure mechanisms and high-quality test methods for nanometer technologies, analog mixed-signal and RF test, memory test, IEEE 1500, system-in-package test, and wafer-probe.
Closing out Test Week are three workshops to choose from. Participants may register for: Design-for-Manufacturability and Yield; Current-and Defect-based Testing; or the new, Automated Test Equipment Vision 2020. These workshops provide in-depth and up-to-the-minute views of work in these important test areas.

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