London software testing news UK

International Test Conference

Posted in Software testing by testing in London on October 24, 2007

International Test Conference 2007 is now in progress in Santa Clara. It runs from
October 23rd to 25th. The Test Week 2007 Advance Program is available here.

International Test Conference, the cornerstone of TestWeek(tm), is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

With the theme “Facing Nanometer-Technology Test Challenges,” the 2007 conference will focus on breakthrough ideas to address the challenges of providing high-quality, cost-effective tests for nanometer-technology designs.

Stress testing 

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