London software testing news UK

IEEE Call For Papers

Posted in Events and improvement,Software testing by testing in London on December 10, 2008

From DBWorld

The 33rd Annual IEEE International Computer Software and Applications Conference (Seattle,Washington, July 20 – 24, 2009

Topics of interest include, but are not limited to:

  • Aspect-oriented software reuse
  • High quality software reuse methods
  • Dependable Component-Based Systems
  • Quality aspects of design patterns
  • Reuse in Service Oriented Systems (SOA)
  • Service & system engineering
  • Service for future internet
  • Internet-based applications
  • Cloud computing
  • Software evolution
  • Software quality metrics and testing
  • Model-driven software engineering
  • Component and service repository
  • Quality-oriented COTS product reuse
  • Reuse in service & component based Enterprise Information Systems
  • Reuse in Embedded Software Systems
  • Reliability and resilient reuse in Transaction-Oriented Systems
  • Case studies and experience reports.

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