London software testing news UK

Efficient testing in a recession

Posted in Software testing by testing in London on January 12, 2009


As the global economic climate places additional constraints on budgets, test engineers are challenged to identify ways to test devices more cost-efficiently than ever before, according to National Instruments (NI), a worldwide player in test and measurement.

NI has identified three trends – software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor test – that will significantly improve the efficiency of test and measurement systems in 2009.

These trends help engineers develop faster and more flexible automated test systems while reducing their overall cost of test, and companies worldwide and from all industry segments can see significant benefits from applying these methods and technologies.

Engineers are using software-defined instrumentation to achieve new levels of measurement performance and lower test costs by applying the latest technological advancements such as multicore processing and field-programmable gate arrays (FPGAs) in their test systems to meet the demands of new application areas such as wireless and protocol-aware test.

Performance load testing

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